Measurement of Double-Layer Forces at the Electrode/Electrolyte Interface Using the Atomic Force Microscope: Potential and Anion Dependent Interactions
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چکیده
The Journal of Physical Chemistry is published by the American Chemical Society. 1155 Sixteenth Street N.W., Washington, DC 20036 Article Measurement of Double-Layer Forces at the Electrode/Electrolyte Interface Using the Atomic Force Microscope: Potential and Anion Dependent Interactions Andrew C. Hillier, Sunghyun Kim, and Allen J. Bard J. Phys. Chem., 1996, 100 (48), 18808-18817 • DOI: 10.1021/jp961629k Downloaded from http://pubs.acs.org on January 23, 2009
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